Improvement in adhesion of aluminum layer on plasma treated poly(phenylene-vinylene) substrates

Journal Article · Sun Dec 31 23:00:00 EST 1995 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.49470· OSTI ID:286463

Nguyen, T P; Lefrant, S ^[1]; Amgaad, K; Cailler, M ^[2]; Tran, V H ^[3]

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1. Laboratoire de Physique Cristalline, Institut des Materiaux de Nantes, 2 rue de la Houssiniere, 44072 Nantes Cedex 03 (France)
2. Laboratoire des Sciences des Surfaces et Interfaces en Mecanique, ISITEM, 2, rue de la Houssiniere, 44072 Nantes Cedex 03 (France)
3. Laboratoires des Materiaux Organiques aux Proprietes Specifiques, CNRS, Vernaison, BP 24, 69 390 Vernaison (France)

We report the results obtained from study of the poly(phenylene-vinylene)-metal interface using X-ray photoelectron spectroscopy (XPS) when the film surface is treated with different gases such as argon, oxygen or nitrogen then covered with aluminum layer. Analysis of the spectra recorded the interface regions reveals that important modifications both in the nature of the carbon bonding and in the thickness of the interface have occurred. The results are related to the adhesive strength of the aluminum layer on the polymer substrates which is found to increase with subsequent oxygen or nitrogen treatment. {copyright} {ital 1996 American Institute of Physics.}

• Sponsoring Organization: USDOE
• OSTI ID: 286463
• Report Number(s): CONF-950119--
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 354; ISSN 0094-243X; ISSN APCPCS
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
40 CHEMISTRY
ADHESION
ALUMINIUM
BINDING ENERGY
CARBON
NITROGEN
OXYGEN
PHOTOELECTRON SPECTROSCOPY
POLYPHENYLS
POLYVINYLS
SURFACE TREATMENTS
THIN FILMS