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X-ray holographic microscopy by means of photoresist recording and atomic-force microscope readout

Journal Article · · Journal of the Optical Society of America, Part A: Optics and Image Science
;  [1]; ;  [2]
  1. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
  2. Department of Physics, State University of New York, Stony Brook, New York 11794-3800 (United States)

We have reconstructed in-line (or Gabor) x-ray holograms at 40{endash}50-nm resolution from a complex biological specimen. The holograms were recorded as a relief pattern on photoresist with use of 1.89-nm, soft x rays from the X1A undulator beam line at the National Synchrotron Light Source at Brookhaven National Laboratory. We have improved the resolution and the fidelity and simplified the experiment compared with earlier work by employing a special atomic-force microscope to examine and digitize the holograms. Following digitization the holograms were reconstructed numerically, allowing both the absorptive and phase-shifting properties of the reconstructed object to be mapped. A comparison of the reconstructed images with images obtained from visible light and transmission electron microscopes has been made to confirm the validity of the x-ray holographic technique. The method offers promise as a technique for soft-x-ray microscopy and diffraction tomography of dry and frozen hydrated specimens and for microscopy with pulsed x-ray sources. {copyright} {ital 1996 Optical Society of America.}

Research Organization:
Brookhaven National Laboratory
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-76CH00016; FG02-89ER60858
OSTI ID:
286935
Journal Information:
Journal of the Optical Society of America, Part A: Optics and Image Science, Journal Name: Journal of the Optical Society of America, Part A: Optics and Image Science Journal Issue: 9 Vol. 13; ISSN JOAOD6; ISSN 0740-3232
Country of Publication:
United States
Language:
English

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