High-precision penetration-depth measurement of YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} as a function of oxygen content

Journal Article · Sat Jun 01 00:00:00 EDT 1996 · Physical Review, B: Condensed Matter

DOI:https://doi.org/10.1103/PhysRevB.53.R14745· OSTI ID:284715

Fuchs, A; Prusseit, W; Berberich, P; Kinder, H ^[1]

---

1. Physik Department E10, Technische Universitaet Muenchen, 85747 Garching (Germany)

A mutual-inductance technique has been used for the high accuracy determination of the absolute London penetration depth in YBa{sub 2}Cu{sub 3}O{sub 7{minus}{delta}} thin films. In order to study the influence of the CuO chains, the oxygen content has been varied in a wide range. At low temperatures the penetration depths obey power laws that depend on the sample but not at all on its oxygen depletion. This finding is best explained in terms of {ital d}-wave pairing with impurity scattering located in the CuO{sub 2} planes. {copyright} {ital 1996 The American Physical Society.}

• OSTI ID: 284715
• Journal Information: Physical Review, B: Condensed Matter, Vol. 53, Issue 22; Other Information: PBD: Jun 1996
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
HIGH-TC SUPERCONDUCTORS
PENETRATION DEPTH
YTTRIUM OXIDES
BARIUM OXIDES
COPPER OXIDES
THIN FILMS
D WAVES
OXYGEN
TEMPERATURE DEPENDENCE