Ion divergence in magnetically insulated diodes
- Sandia National Laboratories, Albuquerque, New Mexico 87185-1186 (United States)
Magnetically insulated ion diodes are being developed to drive inertial confinement fusion. Ion beam microdivergence must be reduced to achieve the very high beam intensities required to achieve this goal. Three-dimensional particle-in-cell simulations [Phys. Rev. Lett. {bold 67}, 3094 (1991)] indicate that instability-induced fluctuations can produce significant ion divergence during acceleration. These simulations exhibit a fast growing mode early in time, which has been identified as the diocotron instability. The divergence generated by this mode is modest, due to the relatively high-frequency ({approx_gt}1 GHz). Later, a low-frequency low-phase-velocity instability develops with a frequency that is approximately the reciprocal of the ion transit time. This instability couples effectively to the ions, and can generate unacceptably large ion divergences ({approx_gt}30 mrad). Linear stability theory reveals that this mode has structure parallel to the applied magnetic field and is related to the modified two-stream instability. Measurements of ion density fluctuations and energy-momentum correlations have confirmed that instabilities develop in ion diodes and contribute to the ion divergence. In addition, spectroscopic measurements indicate that lithium ions have a significant transverse temperature very close to the emission surface. Passive thin-film lithium fluoride (LiF) anodes have larger transverse beam temperatures than laser-irradiated active sources. Calculations of the ion beam source divergence for the LiF film due to surface roughness and the possible loss of adhesion and fragmentation of this film are presented. {copyright} {ital 1996 American Institute of Physics.}
- Research Organization:
- Sandia National Laboratory
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 282929
- Journal Information:
- Physics of Plasmas, Journal Name: Physics of Plasmas Journal Issue: 5 Vol. 3; ISSN PHPAEN; ISSN 1070-664X
- Country of Publication:
- United States
- Language:
- English
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