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Evolution and control of ion-beam divergence in applied- B diodes

Journal Article · · Physical Review Letters; (United States)

The time evolution of beam divergence induced by electomagnetic instabilities in applied-{ital B} ion diodes is examined using the 3D particle-in-cell code QUICKSILVER. The evolution is generally characterized by a high-frequency, low-divergence phase, associated with the diocotron mode, followed by a low-frequency, high-divergence phase, associated with the two-stream-like ion mode. Limiting the extent of the electron density profile evolution allows the diocotron phase to be sustained with a resulting divergence of {approx}10 mrad.

DOE Contract Number:
AC04-76DP00789
OSTI ID:
6130168
Journal Information:
Physical Review Letters; (United States), Journal Name: Physical Review Letters; (United States) Vol. 67:22; ISSN PRLTA; ISSN 0031-9007
Country of Publication:
United States
Language:
English