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Scanning tunneling microscopy investigation of the dimer vacancy{endash}dimer vacancy interaction on the Si(001) 2{times}{ital n} surface

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
DOI:https://doi.org/10.1116/1.589173· OSTI ID:280139
; ;  [1];  [2];  [1]
  1. Department of Physics, University of Texas at Austin, Austin, Texas 78712 (United States)
  2. University of Wisconsin, Madison, Wisconsin 53706 (United States)

Scanning tunneling microscopy has been used to investigate the formation of the 2{times}{ital n} vacancy line structure on Si(001). We find that quenching the surface from high temperatures results in the formation of vacancies. After further quenching, these vacancies nucleate into chains running perpendicular to the dimer rows. Finally, the vacancy chains connect and develop into vacancy lines which extend for many thousands of A{close_quote}s. Each vacancy line consists of mainly two types of dimer vacancies: (1) a di-vacancy and (2) a combination of a single vacancy and a di-vacancy separated by an isolated dimer. All the vacancy lines together with the dimer rows form a 2{times}{ital n} structure with 6{le}{ital n}{le}12. Calculations using the Stillinger{endash}Weber potential support the view that the formation of the vacancy line structure is due to the interaction between vacancies. {copyright} {ital 1996 American Vacuum Society}

Research Organization:
Oak Ridge National Laboratory
DOE Contract Number:
AC05-84OR21400
OSTI ID:
280139
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 2 Vol. 14; ISSN JVTBD9; ISSN 0734-211X
Country of Publication:
United States
Language:
English

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