In-plane and {cflx {ital c}}-axis microwave penetration depth of Bi{sub 2}Sr{sub 2}Ca{sub 1}Cu{sub 2}O{sub 8+{delta}} crystals
- Physics Department, Northeastern University, 360 Huntington Avenue, Boston, Massachusetts 02115 (United States)
- Material Science Division, Brookhaven National Laboratory, P.O. Box 5000, Upton, New York 11973 (United States)
- Superconductivity Research Laboratory, ISTEC 10-13, Shinonome I-chrome, Koto-ku, Tokyo, 135 (Japan)
The complete temperature dependences of the in-plane and {cflx {ital c}}-axis microwave (10 GHz) penetration depth {lambda}({ital T}) and the surface resistance {ital R}{sub {ital s}}({ital T}) of high quality Bi{sub 2}Sr{sub 2}Ca{sub 1}Cu{sub 2}O{sub 8+{delta}} crystals are reported. In contrast to earlier measurements, a leading {lambda}{sub {ital ab}}{proportional_to}{ital T} dependence is observed at low temperatures, consistent with nodes in the in-plane gap. The overall behavior of {lambda}{sub {ital ab}}({ital T}) and {ital R}{sub {ital sab}}({ital T}) is similar to that of YBa{sub 2}Cu{sub 3}O{sub {ital y}} at low {ital T}, but differs at temperatures near {ital T}{sub {ital c}}. The {cflx {ital c}}-axis penetration depth {lambda}{sub {ital c}}({ital T}) is shown to best agree with a model of weakly coupled superconducting layers with nodes in the gap. {copyright} {ital 1995 The American Physical Society.}
- Research Organization:
- Brookhaven National Laboratory
- DOE Contract Number:
- AC02-76CH00016
- OSTI ID:
- 277353
- Journal Information:
- Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 24 Vol. 75; ISSN 0031-9007; ISSN PRLTAO
- Country of Publication:
- United States
- Language:
- English
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