High productivity geochemical XRF analysis
- British Geological Survey, Nottingham (United Kingdom)
- Philips Analytical X-Ray, Almelo (Netherlands)
XRF has become over the years a method of choice when dealing with elemental analysis of large quantities of samples. Geochemical analysis pushes the technique to its limits because of the large number of samples to be analysed as well as the lower limits of detection required for many trace elements of geochemical and economic importance. The Analytical Geochemistry Group at the British Geological Survey (BGS) has access to a wide variety of methods for instrumental analysis. Instrumental methods for inorganic analysis include x-ray fluorescence as well as DC arc emission spectrometry, atomic absorption spectrometry, inductively coupled plasma optical emission spectrometry (ICP-OES) and inductively coupled plasma optical emission spectrometry (ICP-MS). X-ray fluorescence, however, is the technique of choice when it comes to the routine analysis of large numbers of solid samples. The XRF section at BGS currently runs three sequential spectrometers (one PW1480 and two PW2400s made by Philips Analytical X-Ray). In this paper, some aspects of the method of sample preparation and the calibration of the spectrometers for the analysis of the trace elements are discussed. 10 refs., 3 figs., 4 tabs.
- OSTI ID:
- 272843
- Journal Information:
- Advances in X-Ray Analysis, Journal Name: Advances in X-Ray Analysis Vol. 37; ISSN AXRAAA; ISSN 0376-0308
- Country of Publication:
- United States
- Language:
- English
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