Interfacial properties of YBa{sub 2}Cu{sub 3}O{sub 7-x} thin films on Al{sub 2}O{sub 3} substrates prepared by pulsed laser deposition

Journal Article · Sat Jun 01 04:00:00 EDT 1996 · Journal of Electronic Materials

DOI:https://doi.org/10.1007/BF02666732· OSTI ID:263166

Lee, S Y; Park, H H ^[1]

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1. Yonsei Univ., Seoul (Korea, Republic of)

The interfaces of YBa{sub 2}Cu{sub 3}O{sub 7-x} (YBCO) superconducting thin films grown on (11 02) r-plane Al{sub 2}O{sub 3} by pulsed laser deposition have been investigated by a transmission electron microscopy and an Auger electron spectroscopy depth profile. We used the PrBa{sub 2}Cu{sub 3}O{sub 7-x} (PBCO) buffer layer to prevent the interdiffusion and compared the interfaces of YBCO/Al{sub 2}O{sub 3} and YBCO/PBCO/Al{sub 2}O{sub 3}. The intermediate layer in the YBCO film deposited on bare sapphire is visible between the film and the substrate but no boundary layer in the film grown on PBCO buffered sapphire was observed directly by the cross-section image of TEM. The thickness of the intermediate layer in the film on bare sapphire is about 30 nm. This result of TEM observation is consistent with that of AES depth profile. 9 refs., 4 figs.

• Sponsoring Organization: USDOE
• OSTI ID: 263166
• Journal Information: Journal of Electronic Materials, Journal Name: Journal of Electronic Materials Journal Issue: 6 Vol. 25; ISSN JECMA5; ISSN 0361-5235
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
42 ENGINEERING
ALUMINIUM OXIDES
DEPOSITION
INTERFACES
LASER RADIATION
SAPPHIRE
SUBSTRATES
SUPERCONDUCTING FILMS
SURFACE PROPERTIES
TRANSMISSION ELECTRON MICROSCOPY
YTTRIUM COMPOUNDS