Time-tagging data acquisition system for testing superconducting electronics based on an RFSoC and custom analog frontend
- MIT
Novel electronic devices can often be operated in a plethoraof ways, which makes testing circuits comprised of them difficult.Often, no single tool can simultaneously analyze the operatingmargins, maximum speed, and failure modes of a circuit, particularlywhen the intended behavior of subcomponents of the circuit is notstandardized. This work demonstrates a cost-effective time-domaindata acquisition system for electronic circuits that enables moreintricate verification techniques than are practical withconventional experimental setups. We use high-speeddigital-to-analog converters and real-timemulti-gigasample-per-second waveform processing to push experimentalcircuits beyond their maximum operating speed. Our customtime-tagging data capture firmware reduces memory requirements andcan be used to determine when errors occur. The firmware iscombined with a thermal-noise-limited analog frontend with50 dB of dynamic range. Compared to currentlyavailable commercial test equipment that is seven times moreexpensive, this data acquisition system was able to operate asuperconducting shift register at a nearly three-times-higher clockfrequency (200 MHz vs. 80 MHz).
- Research Organization:
- MIT
- Sponsoring Organization:
- US Department of Energy
- Grant/Contract Number:
- 89243024CSC000002
- OSTI ID:
- 2589815
- Report Number(s):
- FERMILAB-PUB-25-0711-V; oai:inspirehep.net:2926325; arXiv:2505.21714
- Journal Information:
- JINST, Journal Name: JINST Journal Issue: 09 Vol. 20
- Country of Publication:
- United States
- Language:
- English
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