Mixed Element Microparticle Characterization by Electron Probe Microanalysis

Riche, Alexis T.; McSwiggen, Peter; Harvey, Kayleigh; Bowden, Shelby; Bergin, Rachel A.; Scott, Spencer M.; Foley, Bryan J.; Samperton, Kyle M.

doi:10.1093/mam/ozaf022

Mixed Element Microparticle Characterization by Electron Probe Microanalysis

Journal Article · Fri Mar 28 00:00:00 EDT 2025 · Microscopy and Microanalysis

DOI:https://doi.org/10.1093/mam/ozaf022· OSTI ID:2544421

; McSwiggen, Peter; Harvey, Kayleigh; Bowden, Shelby; ; Scott, Spencer M.; Foley, Bryan J.;

Abstract

Microparticle compositional characterization for nuclear forensics has traditionally been achieved by “gold-standard” destructive analytical techniques such as large geometry-secondary ion mass spectrometry and fission track-thermal ionization mass spectrometry, but long processing times and total sample consumption eliminate the option of subsequent analysis by other methods. Electron probe microanalysis has long been widely employed for rapid, nondestructive, micrometer-scale compositional measurements and imaging in fields such as material science and geology and may therefore need to be reevaluated as an alternative tool for microparticle analysis for the nuclear forensics community. This study presents the use of electron probe microanalysis for imaging and quantitative characterization of homogeneous microparticles utilizing a calibration curve based on high-precision quadrupole-inductively coupled plasma-mass spectrometry analyses. Samples of opportunity synthesized at Savannah River National Laboratory, nickel-doped cerium oxide microparticles, were selected as analogs for plutonium-doped uranium oxide microparticles. Positive detection and accurate quantification of variable amounts of nickel dopant down to trace levels (10s of parts per million) suggest applicability of this technique to other mixed element systems (e.g., actinides). Quantitative single-particle characterization via electron probe microanalyzer may thus provide a high fidelity, nondestructive complement to techniques currently in use.

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Sponsoring Organization:: USDOE Office of Environmental Management (EM)

Grant/Contract Number:: 89303321CEM000080

OSTI ID:: 2544421

Journal Information:: Microscopy and Microanalysis, Journal Name: Microscopy and Microanalysis Journal Issue: 2 Vol. 31; ISSN 1431-9276

Publisher:: Oxford University PressCopyright Statement

Country of Publication:: United States

Language:: English

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