Atomic-scale secondary electron imaging for heterogeneous catalysis research

Hwang, Sooyeon; Yang, Judith C.

doi:10.1039/d4cy01551g

Atomic-scale secondary electron imaging for heterogeneous catalysis research

Journal Article · Tue Mar 04 04:00:00 EST 2025 · Catalysis Science and Technology

DOI:https://doi.org/10.1039/d4cy01551g· OSTI ID:2543023

^[1]; Yang, Judith C. ^[1]

Brookhaven National Laboratory (BNL), Upton, NY (United States). Center for Functional Nanomaterials (CFN)

Surface characterization at the atomic scale is essential for understanding the catalytic properties of supported metal nanoparticles. Secondary electron (SE) imaging in scanning transmission electron microscopy (STEM) provides three-dimensional surface topographic information, enabling the characterization of the size, morphology, and distribution of supported nanoparticles. Furthermore, real-time observation of catalyst materials in a gaseous environment would enhance the understanding of catalyst dynamics under operational conditions. Ongoing technical developments in SE-STEM and advancements in computational methods are expected to facilitate atomic-scale surface observations and enable more quantitative and statistical analyses. This progress will not only elucidate fundamental mechanisms at the atomic level but also provide comprehensive and universal insights into catalyst performances. Here, this minireview showcases the recent advancements and research findings in surface-sensitive SE imaging in STEM for the characterization of active catalyst materials.

View Accepted Manuscript (DOE)

Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)

Grant/Contract Number:: SC0012704

OSTI ID:: 2543023

Alternate ID(s):: OSTI ID: 2531266

Report Number(s):: BNL--227941-2025-JAAM

Journal Information:: Catalysis Science and Technology, Journal Name: Catalysis Science and Technology Vol. 15; ISSN 2044-4753

Publisher:: Royal Society of ChemistryCopyright Statement

Country of Publication:: United States

Language:: English

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