Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Methods and apparatus for improved thermal monitoring by correlating infrared emissivity to surface topography

Patent ·
OSTI ID:2541858

Embodiments of the present disclosure provide an improved method and apparatus for thermal monitoring for a metal additive manufacturing system. An emissivity value of a top surface of an object to be manufactured is determined based, at least in part, on an arithmetic product of a predetermined roughness value and a predetermined slope-related value. The predetermined roughness value and slope-related values are predetermined based, at least in part, on measurements of a previously manufactured object. The system sinters a metal to form the top surface of the object to be manufactured. An infrared sensor detects radiation from at least a portion of the top surface of the object to be manufactured. A temperature is generated based, at least in part, on the detected infrared radiation and the emissivity value and the generated temperature is applied to a temperature utilization component of the system.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0003525
Assignee:
National Technology & Engineering Solutions of Sandia, LLC (Albuquerque, NM)
Patent Number(s):
11,913,839
Application Number:
16/876,725
OSTI ID:
2541858
Country of Publication:
United States
Language:
English

References (6)

Influences of processing parameters on surface roughness of Hastelloy X produced by selective laser melting journal January 2017
Modeling the effects of surface roughness on the emissivity of aluminum alloys journal November 2006
Surface roughness analysis, modelling and prediction in selective laser melting journal April 2013
In situ measurements of layer roughness during laser powder bed fusion additive manufacturing using low coherence scanning interferometry journal September 2018
Surface texture metrology for metal additive manufacturing: a review journal October 2016
Temperature and Wavelength-Dependent Spectral Absorptivities of Metallic Materials in the Infrared journal January 2006

Similar Records

Apparatus and method for transient thermal infrared emission spectrometry
Patent · Mon Dec 23 23:00:00 EST 1991 · OSTI ID:868102

Apparatus and method for transient thermal infrared spectrometry of flowable enclosed materials
Patent · Mon Mar 01 23:00:00 EST 1993 · OSTI ID:868687

Apparatus and method for transient thermal infrared spectrometry
Patent · Mon Dec 02 23:00:00 EST 1991 · OSTI ID:868083

Related Subjects