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Commissioning of Extended Electron Beam Ion Source at Brookhaven National Laboratory

Journal Article · · Journal of Instrumentation
Here, the Extended Electron Beam Ion Source (EEBIS) has been installed and commissioned at Brookhaven National Laboratory (BNL) hadron accelerator complex in the spring of 2023. EEBIS has replaced its predecessor, RhicEBIS, which provided ions for BNL hadron facilities for over a decade since 2009. The motivations for the source upgrade are to provide higher intensities of the Au32+ ion beam for the Relativistic Heavy Ion Collider (RHIC) and to provide of an intense source of polarized 3He2+ ions for the future Electron Ion Collider (EIC) at BNL. EEBIS is and will continue to be the primary source for a variety of different ion species for the NASA Space Radiation Laboratory (NSRL) at BNL. EEBIS utilizes two identical, two-meter-long unshielded 5T warm bore superconducting solenoids, and it is operated with electron beam current up to 10 A, providing a high-capacity ion traps to fulfill the requirement for high intensity ion beams. The upstream solenoid contains a “short ion trap” with a length of 95 cm, while the “long ion trap” with a length of 178 cm is located inside the downstream solenoid bore. The main features of EEBIS are: * A Gas injection and ionization cell equipped with a Lorenz pulse valve * High-capacity ZAO non-evaporable getter (NEG) custom linear pumping units * In situ apparatus for pumping speed measurements to monitor NEG activation and saturation * “External drift tube” construction with differential pumping stages to provide space for Lorentz pulse valve and 3He high-field polarization cell * A Ba oxide electron gun cathode. The design of EEBIS as well as the results of its commissioning and first-year operation are presented and discussed.
Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
National Aeronautics and Space Administration (NASA); USDOE Office of Science (SC), Nuclear Physics (NP)
Grant/Contract Number:
SC0012704
OSTI ID:
2530897
Report Number(s):
BNL--227931-2025-JAAM
Journal Information:
Journal of Instrumentation, Journal Name: Journal of Instrumentation Journal Issue: 02 Vol. 20; ISSN 1748-0221
Publisher:
Institute of Physics (IOP)Copyright Statement
Country of Publication:
United States
Language:
English

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