Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Development of highly efficient NEG pumping system for EBIS

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.5127751· OSTI ID:1575914
Ultrahigh vacuum inside the ion trap volume is crucial for stable and reliable operation of an Electron Beam Ion Source (EBIS). We have developed and tested a compact linear pumping system based on the ZAO Non-Evaporable Getter (NEG) module with high pumping speed and enhanced sorption capacity for all active gases. Due to its minimal transverse dimensions, the system can be mounted adjacent to the ion trap inside a superconducting solenoid bore and will provide a pumping speed of the order of 1000 l/s for all active gases in that area. An externally supplied current (100 A DC) is used to heat the ZAO NEG up to 650 °C for more than 1 h, which is required for pump activation and/or reactivation cycles. The pumping system is being developed for use in the Extended EBIS Upgrade which is presently in progress at BNL. In conclusion, the design of the system and results of multiple tests are presented and discussed.
Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE; USDOE Office of Science (SC), Nuclear Physics (NP) (SC-26)
Grant/Contract Number:
SC0012704
OSTI ID:
1575914
Alternate ID(s):
OSTI ID: 1619298
OSTI ID: 1573852
OSTI ID: 1579506
Report Number(s):
BNL-211631-2019-COPA
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 11 Vol. 90; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English

References (2)

EBIS charge breeder for CARIBU journal February 2014
Reliable operation of the Brookhaven EBIS for highly charged ion production for RHIC and NSRL
  • Beebe, E.; Alessi, J.; Binello, S.
  • PROCEEDINGS OF THE XII INTERNATIONAL SYMPOSIUM ON ELECTRON BEAM ION SOURCES AND TRAPS, AIP Conference Proceedings https://doi.org/10.1063/1.4905394
conference January 2015

Similar Records

Development of highly efficient NEG pumping system for EBIS
Conference · Fri Nov 01 00:00:00 EDT 2019 · OSTI ID:1579506

Commissioning of Extended Electron Beam Ion Source at Brookhaven National Laboratory
Journal Article · Tue Feb 25 19:00:00 EST 2025 · Journal of Instrumentation · OSTI ID:2530897

Related Subjects