Module and Crate Subsystem Test Hardware Configuration: HN 102

Technical Report · Mon Jun 10 04:00:00 EDT 1991

DOI:https://doi.org/10.2172/2510809· OSTI ID:2510809

Gonzalez, H. ^[1]; Kowald, W. ^[1]; Slimmer, D. ^[1]; Swoboda, C. ^[1]

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1. Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)

Each of the modules listed above must be tested before being integrated into crate subsystems as shown in Figure 1. This document details the hardware configurations required to test both individual PC and DE modules and modules assembled into crate subsystems. Detailed diagnostic test information for the FSCC, MTC, and SEQ can be found in the individual hardware and software description manuals for each module. The hardware and software description documents are listed in Table L

• Research Organization: Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)
• Sponsoring Organization: USDOE Office of Science (SC), High Energy Physics (HEP)
• DOE Contract Number: 89243024CSC000002
• OSTI ID: 2510809
• Report Number(s): FERMILAB-TM--2853; oai:inspirehep.net:2872447
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS