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Characterization of SiO{sub 2}-overcoated silver-island films as substrates for surface-enhanced Raman scattering

Journal Article · · Analytical Chemistry
DOI:https://doi.org/10.1021/ac950860b· OSTI ID:249632

Vapor deposition of a 45-A layer of silver and a subsequent 50-65-A layer of SiO{sub 2} onto a glass slide is shown to be a viable substrate for surface-enhanced Raman spectroscopy (SERS) and a model of the silica surface suitable for adsorption kinetic studies. The chemistry of the silica is characterized by UV absorption and contact angle measurements. The physical structure is probed by atomic force microscopy to compare the surface roughness of the silver-island film and its SiO{sub 2} overcoat. Auger electron spectroscopy and X-ray photoelectron spectroscopy are used to probe the silica layer for exposure of silver through gaps in the overcoat. Comparison of SERS of dibenzyl disulfide bound to a silver-island film versus that of a silver film protected by the SiO{sub 2} overlayer tests the continuity of the SiO{sub 2} film and its ability to block access of adsorbates to the underlying silver surface. The model silica surface is used to detect the Raman spectrum of adsorbed pyridine and its adsorption isotherm; the adsorbate vibrational frequencies are consistent with previous reports of pyridine on silica. 41 refs., 11 figs., 2 tabs.

OSTI ID:
249632
Journal Information:
Analytical Chemistry, Journal Name: Analytical Chemistry Journal Issue: 6 Vol. 68; ISSN ANCHAM; ISSN 0003-2700
Country of Publication:
United States
Language:
English

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