Spectroscopic characterization and evaluation of SiO{sub 2}-overcoated silver islands as a SERS substrate
- Univ. of Utah, Salt Lake City, UT (United States)
Vacuum deposition of a 50-{Angstrom} layer of silver and a subsequent 50-{Angstrom} layer of SiO{sub 2} onto glass is shown to be a viable substrate for Surface-Enhanced Raman Spectroscopy (SERS) and a suitable model of silica surfaces. The model silica surface is characterized by SERS, Atomic Force Microscopy (AFM), and Auger Electron Spectroscopy (AES). SERS of pyridine adsorption onto the SiO{sub 2} overlayer was used to characterize differences between the silica and silver surfaces. Adsorption isotherm and kinetic data for surfactant adsorption at the silica/solution interface have been elucidated with SERS employing the SiO{sub 2}/Ag substrates. Surface roughness relative to the underlying silver-island film and general structure of the substrate was measured with contact mode AFM. AES was used to probe the silica surface for possible exposure of silver through pinholes in the silica overcoat; the {open_quotes}pinhole percentage{close_quotes} was determined to be {<=} 1%
- OSTI ID:
- 126092
- Report Number(s):
- CONF-950402--
- Country of Publication:
- United States
- Language:
- English
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