Resolution and drift measurements on the advanced photon source beam position monitor

Journal Article · Fri May 05 04:00:00 EDT 1995 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.48058· OSTI ID:249321

Chung, Y; Kahana, E ^[1]

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1. Argonne National Laboratory, Argonne, Illinois 60439 (United States)

The resolution and long-term drift of the Advanced Photon Source (APS) beam position monitor (BPM) electronics were measured using the charged particle beams in the ESRF storage ring with various beam current and configurations (single bunch, 8 and 16 equally spaced bunches, and 1/3-fill). The energy of the stored electrons was 6 GeV. The integrated BPM electronics system as used for this work is capable of measuring the beam position on a turn-by-turn basis, which can be accumulated for {ital N} turns ({ital N}=2{sup {ital n}}, {ital n}=1,2,...,11) . Estimation of the BPM resolution apart from the low-frequency beam motion was made by measuring the standard deviation in the measured beam position with different {ital N}s. The analysis of the results indicates a BPM resolution of 18/{radical}{ital N} [{mu}m] for the APS storage ring, which is equivalent to 0.07 {mu}m/{radical}Hz. For the miniature insertion device BPM with 2.8 times higher sensitivity, the resolution will be 0.02 {mu}m/{radical}Hz. The long-term drift of the BPM electronics independent of the actual beam motion was measured at 2 {mu}m/hr, which settled after approximately 1.5 hours. This drift can be attributed mainly to the temperature effect. Comparison of the results with the laboratory measurements shows good agreement. Implication of the BPM resolution limit on the proposed global and local beam position feedback systems for the APS storage ring will also be discussed. {copyright} {ital 1995} {ital American} {ital Institute} {ital of} {ital Physics}.

• Research Organization: Argonne National Laboratory (ANL), Argonne, IL
• DOE Contract Number: W-31109-ENG-38
• OSTI ID: 249321
• Report Number(s): CONF-9410219--
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 333; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ADVANCED PHOTON SOURCE
BEAM MONITORING
BEAM POSITION
SPATIAL RESOLUTION