Accelerated Nano-Optical Imaging through Sparse Sampling

Fu, Matthew; Xu, Suheng; Zhang, Shuai; Ruta, Francesco L.; Pack, Jordan; Mayer, Rafael A.; Chen, Xinzhong; Moore, Samuel L.; Rizzo, Daniel J.; Jessen, Bjarke S.; Cothrine, Matthew; Mandrus, David G.; Watanabe, Kenji; Taniguchi, Takashi; Dean, Cory R.; Pasupathy, Abhay N.; Bisogni, Valentina; Schuck, P. James; Millis, Andrew J.; Liu, Mengkun; Basov, D. N.

doi:10.1021/acs.nanolett.3c03733

Accelerated Nano-Optical Imaging through Sparse Sampling

Journal Article · Thu Feb 08 00:00:00 EST 2024 · Nano Letters

DOI:https://doi.org/10.1021/acs.nanolett.3c03733· OSTI ID:2472848

^[1]; ^[1]; Zhang, Shuai ^[1]; ^[1]; Pack, Jordan ^[1]; ^[2]; ^[3]; Moore, Samuel L. ^[1]; ^[1]; Jessen, Bjarke S. ^[1]; Cothrine, Matthew ^[4]; ^[5]; ^[6]; ^[6]; Dean, Cory R. ^[1]; ^[1]; Bisogni, Valentina ^[7]; ^[1]; Millis, Andrew J. ^[1]; Liu, Mengkun ^[8] more »

Columbia Univ., New York, NY (United States)
Stony Brook Univ., NY (United States)
Columbia Univ., New York, NY (United States); Stony Brook Univ., NY (United States)
Univ. of Tennessee, Knoxville, TN (United States)
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); Univ. of Tennessee, Knoxville, TN (United States)
National Institute for Materials Science (NIMS), Tsukuba (Japan)
Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)
Stony Brook Univ., NY (United States); Brookhaven National Laboratory (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)

The integration time and signal-to-noise ratio are inextricably linked when performing scanning probe microscopy based on raster scanning. This often yields a large lower bound on the measurement time, for example, in nano-optical imaging experiments performed using a scanning near-field optical microscope (SNOM). Here, in this study, we utilize sparse scanning augmented with Gaussian process regression to bypass the time constraint. We apply this approach to image charge-transfer polaritons in graphene residing on ruthenium trichloride (α-RuCl₃) and obtain key features such as polariton damping and dispersion. Critically, nano-optical SNOM imaging data obtained via sparse sampling are in good agreement with those extracted from traditional raster scans but require 11 times fewer sampled points. As a result, Gaussian process-aided sparse spiral scans offer a major decrease in scanning time.

View Accepted Manuscript (DOE)

Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: Gordon and Betty Moore Foundation (GBMF); Japan Society for the Promotion of Science (JSPS); USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0012704; SC0019443

OSTI ID:: 2472848

Report Number(s):: BNL--226261-2024-JAAM

Journal Information:: Nano Letters, Journal Name: Nano Letters Journal Issue: 7 Vol. 24; ISSN 1530-6984

Publisher:: American Chemical SocietyCopyright Statement

Country of Publication:: United States

Language:: English

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36 MATERIALS SCIENCE
gaussian process regression
polaritons
scanning near-field optical microscopy (snom)
sparse sampling

Accelerated Nano-Optical Imaging through Sparse Sampling

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