Atomic resolution scanning transmission electron microscopy at liquid helium temperatures for quantum materials

Mun, Junsik; Potemkin, Daniel; Jang, Houk; Park, Suji; Mick, Stephen; Petrovic, Cedomir; Cheong, Sang-Wook; Han, Myung-Geun; Zhu, Yimei

doi:10.1016/j.ultramic.2024.114039

Atomic resolution scanning transmission electron microscopy at liquid helium temperatures for quantum materials

Journal Article · Sat Sep 07 00:00:00 EDT 2024 · Ultramicroscopy

DOI:https://doi.org/10.1016/j.ultramic.2024.114039· OSTI ID:2466136

Mun, Junsik ^[1]; Potemkin, Daniel ^[2]; Jang, Houk ^[3]; Park, Suji ^[3]; Mick, Stephen ^[4]; Petrovic, Cedomir ^[1]; Cheong, Sang-Wook ^[5]; ^[1]; Zhu, Yimei ^[1]

Brookhaven National Laboratory (BNL), Upton, NY (United States). Condensed Matter Physics and Materials Science Dept.
Brookhaven National Laboratory (BNL), Upton, NY (United States). Condensed Matter Physics and Materials Science Dept.; Stony Brook Univ., NY (United States)
Brookhaven National Laboratory (BNL), Upton, NY (United States). Center for Functional Nanomaterials (CFN)
Gatan Inc., Pleasanton, CA (United States)
Rutgers Univ., Piscataway, NJ (United States)

Fundamental quantum phenomena in condensed matter, ranging from correlated electron systems to quantum information processors, manifest their emergent characteristics and behaviors predominantly at low temperatures. This necessitates the use of liquid helium (LHe) cooling for experimental observation. Atomic resolution scanning transmission electron microscopy combined with LHe cooling (cryo-STEM) provides a powerful characterization technique to probe local atomic structural modulations and their coupling with charge, spin and orbital degrees-of-freedom in quantum materials. However, achieving atomic resolution in cryo-STEM is exceptionally challenging, primarily due to sample drifts arising from temperature changes and noises associated with LHe bubbling, turbulent gas flow, etc. In this work, we demonstrate atomic resolution cryo-STEM imaging at LHe temperatures using a commercial side-entry LHe cooling holder. Firstly, we examine STEM imaging performance as a function of He gas flow rate, identifying two primary noise sources: He-gas pulsing and He-gas bubbling. Secondly, we propose two strategies to achieve low noise conditions for atomic resolution STEM imaging: either by temporarily suppressing He gas flow rate using the needle valve or by acquiring images during the natural warming process. Lastly, we show the applications of image acquisition methods and image processing techniques in investigating structural phase transitions in Cr₂Ge₂Te₆, CuIr₂S₄, and CrCl₃. In conclusion, our findings represent an advance in the field of atomic resolution electron microscopy imaging for quantum materials and devices at LHe temperatures, which can be applied to other commercial side-entry LHe cooling TEM holders.

View Accepted Manuscript (DOE)

Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF); USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE)

Grant/Contract Number:: SC0012704; FG02-07ER46382

OSTI ID:: 2466136

Alternate ID(s):: OSTI ID: 2447170

Report Number(s):: BNL--226246-2024-JAAM

Journal Information:: Ultramicroscopy, Journal Name: Ultramicroscopy Vol. 267; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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