Atomic Resolution Cryogenic 4D-STEM Imaging via Robust Distortion Correction

Smith, Jacob; Huang, Zhennan; Gao, Wenpei; Zhang, Guannan; Chi, Miaofang

doi:10.1021/acsnano.2c12777

Atomic Resolution Cryogenic 4D-STEM Imaging via Robust Distortion Correction

Journal Article · Fri Jun 09 00:00:00 EDT 2023 · ACS Nano

DOI:https://doi.org/10.1021/acsnano.2c12777· OSTI ID:2438689

^[1]; Huang, Zhennan ^[2]; ^[3]; ^[4]; ^[2]

North Carolina State University, Raleigh, NC (United States); Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
North Carolina State University, Raleigh, NC (United States)
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Cryogenic four-dimensional scanning transmission electron microscopy (4D-STEM) imaging is a useful technique for studying quantum materials and their interfaces by simultaneously probing charge, lattice, spin, and chemistry on the atomic scale with the sample held at temperatures ranging from room to cryogenic. However, its applications are currently limited by the instabilities of cryo-stages and electronics. To overcome this challenge, we develop an algorithm to effectively correct the complex distortions present in atomic resolution cryogenic 4D-STEM data sets. This method uses nonrigid registration to identify localized distortions in a 4D-STEM and relate them to an undistorted experimental STEM image, followed by a series of affine transformations for distortion corrections. This method allows a minimum loss of information in both reciprocal and real spaces, enabling the reconstruction of sample information from 4D-STEM data sets. This method is computationally cheap, fast, and applicable for on-the-fly data analysis in future in situ cryogenic 4D-STEM experiments.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 2438689

Journal Information:: ACS Nano, Journal Name: ACS Nano Journal Issue: 12 Vol. 17; ISSN 1936-0851

Publisher:: American Chemical Society (ACS)Copyright Statement

Country of Publication:: United States

Language:: English

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Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
4D-STEM
Affine transformations
Algorithms
Cryogenic
Distortion correction
Lattices
Materials
Probes
Scanning transmission electron microscopy
Transmission electron microscopy
Triangularization

Atomic Resolution Cryogenic 4D-STEM Imaging via Robust Distortion Correction

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References (27)

Figures / Tables (4)

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