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Nanostructured thin films for Meissner-Effect Transition-Edge-Sensor Devices

Conference · Tue Aug 01 00:00:00 EDT 2023

DOI:https://doi.org/10.2172/2430375· OSTI ID:2430375

Finnegan, Patrick Sean ^[1]; Arrington, Christian Lew ^[1]; St. John, Christopher ^[1]; Carr, Stephen M. ^[1]

Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

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Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: NA0003525

OSTI ID:: 2430375

Report Number(s):: SAND2023-08081C

Country of Publication:: United States

Language:: English

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