Calibrating cryogenic temperature of TEM specimens using EELS

Kumar, Abinash; Tiukalova, Elizaveta; Venkatraman, Kartik; Lupini, Andrew; Hachtel, Jordan A.; Chi, Miaofang

doi:10.1016/j.ultramic.2024.114008

Calibrating cryogenic temperature of TEM specimens using EELS

Journal Article · Mon Jul 08 00:00:00 EDT 2024 · Ultramicroscopy

DOI:https://doi.org/10.1016/j.ultramic.2024.114008· OSTI ID:2428082

Kumar, Abinash ^[1]; Tiukalova, Elizaveta ^[1]; Venkatraman, Kartik ^[1]; ^[1]; ^[1]; ^[1]

Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Cryogenic Scanning/Transmission Electron Microscopy has been established as a leading method to image sensitive biological samples and is now becoming a powerful tool to understand materials' behavior at low temperatures. However, achieving precise local temperature calibration at low temperatures remains a challenge, which is especially crucial for studying phase transitions and emergent physical properties in quantum materials. In this study, we employ electron energy loss spectroscopy (EELS) to measure local cryogenic specimen temperatures. Here we use the temperature-dependent characteristics of aluminum's bulk plasmon peak in EEL spectra, which shifts due to changes in electron density caused by thermal expansion and contraction. We successfully demonstrate the versatility of this method by calibrating different liquid nitrogen cooling holders in various microscopes, regardless of whether a monochromated or non-monochromated electron beam is used. Temperature discrepancies between the actual temperature and the setpoint temperatures are identified across a range from room temperature to 100 K. This work demonstrates the importance of temperature calibrations at intermediate temperatures and presents a straightforward, robust method for calibrating local temperatures of cryogenically-cooled specimens in electron microscopes.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 2428082

Journal Information:: Ultramicroscopy, Journal Name: Ultramicroscopy Vol. 265; ISSN 0304-3991

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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