Measuring nanoscale thermal gradients in suspended MoS2 with STEM-EELS

Shen, Lang; Mecklenburg, Matthew; Dhall, Rohan; Regan, B. C.; Cronin, Stephen B.

doi:10.1063/1.5094443

Title: Measuring nanoscale thermal gradients in suspended MoS2 with STEM-EELS

Journal Article · Wed Oct 09 00:00:00 EDT 2019 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.5094443· OSTI ID:1592508

;

; Dhall, Rohan; Regan, B. C.;

Transition metal dichalcogenides such as molybdenum disulfide (MoS2) may see service in the heart of next-generation nanoelectronic devices, where highly localized power dissipation can produce nontrivial temperature gradients over nanometer-scale distances. Here, we demonstrate that MoS2 is a promising target for plasmon energy expansion thermometry (PEET), a high-spatial resolution temperature mapping technique employed in a scanning transmission electron microscope (STEM) equipped with electron energy loss spectroscopy (EELS). We first use a calibrated, commercial MEMS-style TEM sample heater chip to measure the temperature dependence of the MoS2 bulk plasmon. We corroborate the chip's temperature calibration with Raman thermometry and determine the bulk thermal expansion coefficient (TEC) of MoS2 in the temperature range of 300–1100 K. Applying this TEC value to PEET measurements on a suspended MoS2 flake, we map 70–90 K/μm temperature gradients with a submicrometer spatial resolution.

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Sponsoring Organization:: USDOE

Grant/Contract Number:: FG02-07ER46376

OSTI ID:: 1592508

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Vol. 115 Journal Issue: 15; ISSN 0003-6951

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 5 works

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