Open-circuit submodule fault diagnosis in MMCs using support vector machines

Mohammadhassani, Ardavan; Mehrizi‐Sani, Ali

doi:10.1049/gtd2.12652

Open-circuit submodule fault diagnosis in MMCs using support vector machines

Journal Article · Sat Oct 29 00:00:00 EDT 2022 · IET Generation, Transmission, & Distribution

DOI:https://doi.org/10.1049/gtd2.12652· OSTI ID:2424784

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Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)

Series connection of semiconductor submodules (SM) in a modular multilevel converter (MMC) makes the MMC prone to open-circuit (OC) IGBT failures inside SMs. If left undetected, these faults degrade the operation of the MMC and lead to its instability. This article proposes a method to detect, localise, and classify single OC SM faults in an MMC using support vector machines (SVM) trained with data obtained from the capacitor voltage balancing block of the MMC control system. The proposed method relies on data extracted from the sorted capacitor voltage arrays of the upper and lower phase arms. Therefore, it does not require extra measurements and hardware. Additionally, it offers a fixed time for detecting and localising OC SM faults. This method is easy to implement as SVM has a simple decision function. Time-domain simulation case studies are performed on a three-phase nine-level MMC to evaluate the performance of the proposed method.

View Accepted Manuscript (DOE)

Research Organization:: Virginia Polytechnic Inst. and State Univ., Blacksburg, VA (United States)

Sponsoring Organization:: USDOE

OSTI ID:: 2424784

Journal Information:: IET Generation, Transmission, & Distribution, Journal Name: IET Generation, Transmission, & Distribution Journal Issue: 24 Vol. 16; ISSN 1751-8687

Publisher:: Institution of Engineering and Technology (IET)Copyright Statement

Country of Publication:: United States

Language:: English

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