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Unraveling the size fluctuation and shrinkage of nanovoids during in situ radiation of Cu by automatic pattern recognition and phase field simulation

Journal Article · · Journal of Nuclear Materials
 [1];  [1];  [1];  [2];  [1];  [3];  [4];  [1];  [1];  [1]
  1. Purdue University, West Lafayette, IN (United States)
  2. University of Hong Kong (Hong Kong)
  3. Harbin Institute of Technology, Shenzhen (Hong Kong)
  4. Purdue University, West Lafayette, IN (United States); School of Electrical and Computer Engineering, West Lafayette, IN (United States)
Void formation is an important aspect of irradiation response of metals. In situ transmission electron microscopy observation for void evolution during irradiation is an effective technique for studying void evolution. However, the amount of data collected during in situ studies drastically overwhelm the current capability for manual data analyses. Here, we used a data-driven approach where a convolutional neural network combined with greedy matching to detect and track nanovoid evolutions and migrations. This approach was able to discover the surprising phenomena of void size fluctuation and shrinkage during irradiation of Cu with pre-existing nanovoids. Phase–field simulations revealed the fundamental mechanism behind this in situ observed phenomenon of void size fluctuation.
Research Organization:
Idaho National Laboratory (INL), Idaho Falls, ID (United States)
Sponsoring Organization:
USDOE Office of Nuclear Energy (NE); USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities (SUF)
Grant/Contract Number:
AC07-05ID14517
OSTI ID:
2424236
Alternate ID(s):
OSTI ID: 1906730
Journal Information:
Journal of Nuclear Materials, Journal Name: Journal of Nuclear Materials Journal Issue: C Vol. 574; ISSN 0022-3115
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English

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