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Optically Active Spin Defects in Few-Layer Thick Hexagonal Boron Nitride

Journal Article · · Physical Review Letters

Optically active spin defects in hexagonal boron nitride (hBN) are promising quantum systems for the design of two-dimensional quantum sensing units offering optimal proximity to the sample being probed. In this Letter, we first demonstrate that the electron spin resonance frequencies of boron vacancy centers ($$V$$$^{–}_{B}$$) can be detected optically in the limit of few-atomic-layer thick hBN flakes despite the nanoscale proximity of the crystal surface that often leads to a degradation of the stability of solid-state spin defects. We then analyze the variations of the electronic spin properties of $$V$$$^{–}_{B}$$ centers with the hBN thickness with a focus on (i) the zero-field splitting parameters, (ii) the optically induced spin polarization rate and (iii) the longitudinal spin relaxation time. Furthermore, this Letter provides important insights into the properties of $$V$$$^{–}_{B}$$ centers embedded in ultrathin hBN flakes, which are valuable for future developments of foil-based quantum sensing technologies.

Research Organization:
Idaho National Laboratory (INL), Idaho Falls, ID (United States)
Sponsoring Organization:
USDOE; Office of Naval Research (ONR)
Grant/Contract Number:
AC07-05ID14517
OSTI ID:
2424233
Journal Information:
Physical Review Letters, Journal Name: Physical Review Letters Journal Issue: 11 Vol. 131; ISSN 0031-9007
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English

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