Correlating electronic properties with M-site composition in solid solution Ti yNb2-yCTx MXenes

Yang, Yizhou; Han, Meikang; Shuck, Christopher E.; Sah, Raj K.; Paudel, Jay R.; Gray, Alexander X.; Gogotsi, Yury; May, Steven J.

doi:10.1088/2053-1583/ac9e68

Correlating electronic properties with M-site composition in solid solution Ti _yNb_2-_yCT_x MXenes

Journal Article · Fri Nov 11 00:00:00 EST 2022 · 2D Materials

DOI:https://doi.org/10.1088/2053-1583/ac9e68· OSTI ID:2420846

Yang, Yizhou ^[1]; ^[2]; ^[2]; Sah, Raj K. ^[3]; Paudel, Jay R. ^[3]; Gray, Alexander X. ^[3]; ^[2]; ^[2]

Drexel Univ., Philadelphia, PA (United States); OSTI
Drexel Univ., Philadelphia, PA (United States)
Temple Univ., Philadelphia, PA (United States)

High electrical conductivity is desired in MXene films for applications such as electromagnetic interference shielding, antennas, and electrodes for electrochemical energy storage and conversion applications. Due to the acid etching-based synthesis method, it is challenging to deconvolute the relative importance that factors such as chemical composition and flake size contribute to resistivity. To understand the intrinsic and extrinsic contributions to the macroscopic electronic transport properties, a systematic study controlling compositional and structural parameters was conducted with eight solid solutions in the Ti_yNb_2-yCT_x system. Here, in particular, we investigated the different roles played by metal (M)-site composition, flake size, and d-spacing on macroscopic transport. Hard x-ray photoemission spectroscopy and spectroscopic ellipsometry revealed changes to electronic structure induced by the M-site alloying. Consistent with the spectroscopic results, the low- and room-temperature conductivities and effective carrier mobility are correlated with the Ti content, while the impact of flake size and d-spacing is most prominent in low-temperature transport. The results provide guidance for designing and engineering MXenes with a wide range of conductivities.

View Accepted Manuscript (DOE)

Research Organization:: Drexel Univ., Philadelphia, PA (United States); Temple Univ., Philadelphia, PA (United States)

Sponsoring Organization:: National Science Foundation (NSF); US Army Research Office (ARO); USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE)

Grant/Contract Number:: SC0018618; SC0019297

OSTI ID:: 2420846

Journal Information:: 2D Materials, Journal Name: 2D Materials Journal Issue: 1 Vol. 10; ISSN 2053-1583

Publisher:: IOP PublishingCopyright Statement

Country of Publication:: United States

Language:: English

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