Radiation-induced charge trapping in bipolar base oxides
Conference
·
OSTI ID:238428
- Sandia National Labs., Albuquerque, NM (United States)
Capacitance-voltage and thermally stimulated current methods are used to investigate radiation induced charge trapping in bipolar base oxides. Results are compared with models of oxide and interface trap charge buildup at low electric fields.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- Department of Defense, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 238428
- Report Number(s):
- SAND--96-0406C; CONF-960773--1; ON: DE96006383
- Country of Publication:
- United States
- Language:
- English
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