Corrosion of SA1388-1 diodes
Conference
·
OSTI ID:238346
- Allied-Signal, Inc., Kansas City, MO (United States)
- Sandia National Labs., Albuquerque, NM (United States)
After 5 y storage at Allied Signal, a subassembly with SA1388-1 diodes failed testing and the cause was an unacceptable current leak rate in one of the diodes. This was traced to a CuS deposit in a single production lot of diodes; however only about 0.3% failed the specification. A study was performed to determine the cause and potential long-term significance of this problem. Probable cause was determined to be the P-bearing braze material not being compatible with the Ag immersion plating solution (cyanide-based) and to the storage environment containing sulfur.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 238346
- Report Number(s):
- SAND--96-1236C; CONF-9604104--9; ON: DE96010530
- Country of Publication:
- United States
- Language:
- English
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