The quality control programme for ITk strip tracker module assembly
Journal Article
·
· Journal of Instrumentation
- Brookhaven National Laboratory (BNL), Upton, NY (United States); ATLAS ITk Collaboration, et al.
The assembly of the ATLAS Inner Tracker requires the construction of 19,000 silicon strip sensor detector modules in eight different geometries. Modules will be assembled and tested at 31 institutes on four continents from sensors, readout chips, and flexes. In order to adhere to the module specifications defined for sufficient tracking performance, a rigorous programme of quality control (QC) was established to cover components at every stage of assembly. Here, this contribution presents an overview of the QC programme for ITk strip tracker modules, issues encountered during the pre-production phase (5% of the production volume), and their solutions.
- Research Organization:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), High Energy Physics (HEP)
- Contributing Organization:
- ATLAS ITk Collaboration
- Grant/Contract Number:
- SC0012704
- OSTI ID:
- 2368830
- Report Number(s):
- BNL--225650-2024-JAAM
- Journal Information:
- Journal of Instrumentation, Journal Name: Journal of Instrumentation Vol. 19; ISSN 1748-0221
- Publisher:
- Institute of Physics (IOP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
The ABC130 barrel module prototyping programme for the ATLAS strip tracker
|
journal | September 2020 |
Similar Records
The ABC130 barrel module prototyping programme for the ATLAS strip tracker
An extreme thermal cycling reliability test of ATLAS ITk Strips barrel modules
Quality concerns caused by quality control — deformation of silicon strip detector modules in thermal cycling tests
Journal Article
·
Wed Sep 02 20:00:00 EDT 2020
· Journal of Instrumentation
·
OSTI ID:1756369
An extreme thermal cycling reliability test of ATLAS ITk Strips barrel modules
Journal Article
·
Wed Oct 02 20:00:00 EDT 2024
· Journal of Instrumentation
·
OSTI ID:2472857
Quality concerns caused by quality control — deformation of silicon strip detector modules in thermal cycling tests
Journal Article
·
Mon Mar 03 19:00:00 EST 2025
· Journal of Instrumentation
·
OSTI ID:2557484