Limiting spectral and angular characteristics of multilayer relief – phase diffraction microstructures

Journal Article · Wed Jul 01 04:00:00 EDT 2020 · Quantum Electronics (Woodbury, N.Y.)

DOI:https://doi.org/10.1070/QEL17278· OSTI ID:23141963

Greisukh, G. I.; Ezhov, E. G.; Antonov, A. I. ^[1]; Danilov, V. A. ^[2]

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1. Penza State University of Architecture and Construction, ul. Germana Titova 28, 440028 Penza (Russian Federation)
2. Scientific and Technological Center of Unique Instrumentation, Russian Academy of Sciences, ul. Butlerova 15, 117342 Moscow (Russian Federation)

Methods for estimating the parameters of relief – phase diffraction microstructures (local and integral Q-factors) are extended to the case of multilayer double-relief sawtooth microstructures, which makes it possible to select the best combinations of optical materials for multilayer microstructures at a very low computational burden. An approach to the study of multilayer microstructures is proposed, based on the combined use of Q-factors and the method of rigorous analysis of coupled waves, which allows one to estimate the limiting spectral and angular characteristics of multilayer microstructures of various types. (paper)

• OSTI ID: 23141963
• Journal Information: Quantum Electronics (Woodbury, N.Y.), Journal Name: Quantum Electronics (Woodbury, N.Y.) Journal Issue: 7 Vol. 50; ISSN 1063-7818; ISSN QUELEZ
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
DIFFRACTION
LAYERS
MICROSTRUCTURE