Ohmic Contacts to CVD Diamond with Boron-Doped Delta Layers
- Institute for Physics of Microstructures, Russian Academy of Sciences (Russian Federation)
- Institute of Applied Physics, Russian Academy of Sciences (Russian Federation)
Various methods for the formation of ohmic contacts to boron-doped δ layers in CVD-diamond epitaxial structures are investigated. In the first variant, an additional thin heavily doped layer was formed on the diamond surface to which an ohmic contact is formed. Then, the surface p{sup +} layer between the contact pads is etched out; therefore, the current in the structure flows only through a buried δ layer. In the second approach, the doped diamond selectively grows in the contact windows under a metallic mask after preliminary etching of the undoped diamond layer (cap) up to the δ layer. In this case, the heavily doped p{sup +} layer forms an end contact to the δ layer. These two variants differ in terms of the conditions of applicability, the complexity of the manufacturing technology, the value of the contact resistance, and can be used to solve problems in which it is necessary to have a different quality of the contacts, such as the formation of transistor structures or test cells for measuring physical characteristics.
- OSTI ID:
- 22944809
- Journal Information:
- Semiconductors, Journal Name: Semiconductors Journal Issue: 10 Vol. 53; ISSN SMICES; ISSN 1063-7826
- Country of Publication:
- United States
- Language:
- English
Similar Records
Atomic composition and electrical characteristics of epitaxial CVD diamond layers doped with boron
The effect of surface treatment on the electrical properties of metal contacts to boron-doped homoepitaxial diamond film
Spectroscopic ellipsometry of homoepitaxial diamond multilayers and delta-doped structures
Journal Article
·
Wed Dec 14 23:00:00 EST 2016
· Semiconductors
·
OSTI ID:22645291
The effect of surface treatment on the electrical properties of metal contacts to boron-doped homoepitaxial diamond film
Journal Article
·
Wed Jan 31 23:00:00 EST 1990
· IEEE Electron Device Letters (Institute of Electrical and Electronics Engineers); (USA)
·
OSTI ID:6816990
Spectroscopic ellipsometry of homoepitaxial diamond multilayers and delta-doped structures
Journal Article
·
Sun Jan 12 23:00:00 EST 2014
· Applied Physics Letters
·
OSTI ID:22275798