Photorefractive Correction of the Coupling Ratio of an Integrated Optical Directional X-Coupler on a Lithium Niobate Substrate

Journal Article · Fri Mar 15 00:00:00 EDT 2019 · Technical Physics Letters

DOI:https://doi.org/10.1134/S1063785019030131· OSTI ID:22929313

Tronev, A. V.; Il’ichev, I. V.; Agruzov, P. M.; Shamrai, A. V. ^[1]

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1. Ioffe Physical Technical Institute, Russian Academy of Sciences (Russian Federation)

The possibility of correcting the power coupling ratio of an integrated optical directional X-coupler upon excitation of a local photorefractive response in the substrate material (LiNbO{sub 3}) has been analyzed. The X-coupler operation has been numerically simulated, and the regions of its maximum sensitivity to photorefraction have been determined. The correspondence between the calculated and experimental data has been obtained. The maximum correction value of the coupling ratio is 1–2%. The photorefractive correction of the coupling ratio has been used to increase the extinction ratio of a Mach–Zehnder modulator to 47 dB.

• OSTI ID: 22929313
• Journal Information: Technical Physics Letters, Journal Name: Technical Physics Letters Journal Issue: 3 Vol. 45; ISSN 1063-7850
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COMPUTERIZED SIMULATION
CORRECTIONS
COUPLING
EXCITATION
EXPERIMENTAL DATA
LITHIUM COMPOUNDS
NIOBATES
REFRACTION