Probability of Electron Capture by {sup 3}He{sup 2+} Ions from Argon Atoms at Different Impact Parameters
Journal Article
·
· Technical Physics
We have measured the absolute values of total cross sections of capture of one and two electrons by He{sup 2+} ions from argon atoms. The differential scattering cross sections have been determined for fast atoms and singly charged helium ions formed in each of these processes (without and with additional ionization of the formed slow argon ion). Measurements have been taken for He{sup 2+} ions with kinetic energy of 6 keV in scattering angle range 0–2.5°. Based on the measured differential cross sections using different model atomic particle interaction potentials, we have calculated the cross sections of these processes as functions of the impact parameter. The probabilities of realization of these processes with electron density distribution in different shells in the target atom have been compared. The applicability of the expressions for the screened Coulomb interaction potentials in the description of scattering of particles that have captured electrons has been demonstrated.
- OSTI ID:
- 22927741
- Journal Information:
- Technical Physics, Journal Name: Technical Physics Journal Issue: 3 Vol. 64; ISSN 1063-7842
- Country of Publication:
- United States
- Language:
- English
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