Effect of Different Zirconium Contents on the Corrosion Resistance of ZrO{sub 2}-TiO{sub 2} Film-Coated Stainless Steel

Journal Article · Mon Oct 15 04:00:00 EDT 2018 · Journal of Materials Engineering and Performance

DOI:https://doi.org/10.1007/S11665-018-3639-5· OSTI ID:22863241

Bu, Aiming; Ji, Guojun; Liu, Quansheng ^[1]; Shi, Zhiming ^[2]

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1. Inner Mongolia University of Technology, College of Chemical Engineering (China)
2. Inner Mongolia University of Technology, College of Material Science and Engineering (China)

This work discusses the corrosion resistance of x%zirconia (ZrO{sub 2})–x%titania (TiO{sub 2}) nanocomposite films with different percentages of ZrO{sub 2} prepared on stainless steel by dipping the substrates in sol–gel solutions. The phase compositions and microstructures of the films were investigated by x-ray diffraction (XRD) and scanning electron microscopy (SEM). Tafel polarization curves and electrochemical impedance spectroscopy (EIS) were employed to investigate the corrosion resistance of the coated steel substrates during immersion in a 5% NaCl solution at room temperature. The results showed that when the percentage of ZrO{sub 2} in the sol–gel was relatively low, the film contained cracks, leading to a poor corrosion resistance. When the percentage of ZrO{sub 2} was higher, the corrosion resistance of the film was also affected by the sintering temperature; a sintering temperature of 650 °C gave the best protection of the metal surface, and the protection efficiency was 95%.

• OSTI ID: 22863241
• Journal Information: Journal of Materials Engineering and Performance, Journal Name: Journal of Materials Engineering and Performance Journal Issue: 10 Vol. 27; ISSN 1059-9495; ISSN JMEPEG
• Country of Publication: United States
• Language: English

Related Subjects

77 NANOSCIENCE AND NANOTECHNOLOGY
CORROSION RESISTANCE
CRACKS
ELECTROCHEMICAL CORROSION
ELECTROCHEMISTRY
IMPEDANCE
MICROSTRUCTURE
NANOCOMPOSITES
POLARIZATION
SCANNING ELECTRON MICROSCOPY
SINTERING
SPECTROSCOPY
STAINLESS STEELS
SUBSTRATES
SURFACES
THIN FILMS
TITANIUM OXIDES
X-RAY DIFFRACTION
ZIRCONIUM OXIDES