Reconstruction of high-resolution atomic force microscopy measurements from fast-scan data using a Noise2Noise algorithm

Natinsky, Eva; Khan, Ryan M.; Cullinan, Michael; Dingreville, Rémi

doi:10.1016/j.measurement.2024.114263

Reconstruction of high-resolution atomic force microscopy measurements from fast-scan data using a Noise2Noise algorithm

Journal Article · Thu Feb 29 23:00:00 EST 2024 · Measurement

DOI:https://doi.org/10.1016/j.measurement.2024.114263· OSTI ID:2283787

; ; Cullinan, Michael;

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Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA), Office of Defense Programs (DP)

OSTI ID:: 2283787

Alternate ID(s):: OSTI ID: 2463073

Journal Information:: Measurement, Journal Name: Measurement Journal Issue: C Vol. 227; ISSN 0263-2241

Publisher:: ElsevierCopyright Statement

Country of Publication:: United Kingdom

Language:: English

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