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Ideal Scan Path for High-Speed Atomic Force Microscopy

Journal Article · Tue Jan 31 23:00:00 EST 2017 · IEEE/ASME Transactions on Mechatronics

DOI:https://doi.org/10.1109/TMECH.2016.2615327· OSTI ID:1343646

Ziegler, Dominik; Meyer, Travis R.; Amrein, Andreas; Bertozzi, Andrea L.; Ashby, Paul D.

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Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-05CH11231; SC0013212

OSTI ID:: 1343646

Alternate ID(s):: OSTI ID: 1343647

Journal Information:: IEEE/ASME Transactions on Mechatronics, Journal Name: IEEE/ASME Transactions on Mechatronics Journal Issue: 1 Vol. 22; ISSN 1083-4435

Publisher:: Institute of Electrical and Electronics EngineersCopyright Statement

Country of Publication:: United States

Language:: English

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