A mechanical microscope: High-speed atomic force microscopy

Journal Article · Sun Jan 16 23:00:00 EST 2005 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.1855407· OSTI ID:20636988

Humphris, A D.L.; Miles, M J; Hobbs, J K ^[1]

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1. University of Bristol, H.H. Wills Physics Laboratory, Tyndall Avenue, Bristol, BS8 1TL (United Kingdom)

An atomic force microscope capable of obtaining images in less than 20 ms is presented. By utilizing a microresonator as a scan stage, and through the implementation of a passive mechanical feedback loop with a bandwidth of more than 2 MHz, a 1000-fold increase in image acquisition rate relative to a conventional atomic force microscope is obtained. This has allowed images of soft crystalline and molten polymer surfaces to be collected in 14.3 ms, with a tip velocity of 22.4 cm s{sup -1} while maintaining nanometer resolution.

• OSTI ID: 20636988
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 3 Vol. 86; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ATOMIC FORCE MICROSCOPY
FEEDBACK
IMAGES
MHZ RANGE 01-100
MICROSCOPES
NANOSTRUCTURES
POLYMERS
RESOLUTION
RESONATORS
SURFACES
TOPOGRAPHY