Optical, morphological and durability studies of quaternary chalcogenide Ge-Sb(As)-(S,Te) films

Journal Article · Mon Oct 15 00:00:00 EDT 2018 · Materials Research Bulletin

DOI:https://doi.org/10.1016/J.MATERRESBULL.2018.06.013· OSTI ID:22805243

Dulgheru, Nicoleta; Stoica, Mihai; Calderon-Moreno, Jose Maria; Anastasescu, Mihai; Nicolescu, Madalina; Stroescu, Hermine; Atkinson, Irina ^[1]; Stanculescu, Ioana ^[2]; Szekeres, Anna; Gartner, Mariuca ^[1]

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1. Institute of Physical Chemistry “Ilie Murgulescu”, Romanian Academy, 202 Splaiul Independentei, 060021 Bucharest (Romania)
2. Horia Hulubei National Institute of Research and Development for Physics and Nuclear Engineering, 30 Aleea Reactorului, 077125 Magurele (Romania)

Highlights: • Films of two glassy chalcogenide systems of Ge{sub x}-Sb/As{sub 40-x}-S{sub 50}-Te{sub 10} were studied. • Optical constants as function of films composition are obtained in 0.25–30 μm range. • The transparent zone of the films is in the (0.6–2.5) μm spectral range. • The vibrational modes were determined from IR-SE, FTIR and Raman. • The stability of the films after QT was proved by AFM, SEM and SE analyses. - Abstract: Thin films from two glassy systems of Ge{sub x}Sb{sub 40-x}S{sub 50}Te{sub 10} and Ge{sub x}As{sub 40-x}S{sub 50}Te{sub 10}, with compositions x = 10, 20 and 27 at. %, were deposited on optical glass substrates by vacuum thermal evaporation of powdered parent chalcogenide glasses. The complex refractive index and dielectric constants of the films are determined by ellipsometry in a wide spectral range of 0.25–30 μm. In the transparent spectral region of 0.6–2.5 μm the refractive index values are within 2.9–2.3 and 3.3–2.4 for the As-contained and Sb-contained films, respectively. From the IR and Raman data analysis the basic chemical and oxygen-related impurity bonds are identified. The films durability properties were established by applying the US Military Standard quality tests. The quality-test-induced-changes in surface morphology were evaluated. The films are relatively stable after quality test treatments, which cause a small degree of densification and surface roughening for Sb-containing films and surface flattening for As-containing ones.

• OSTI ID: 22805243
• Journal Information: Materials Research Bulletin, Vol. 106; Other Information: Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ATOMIC FORCE MICROSCOPY
CHALCOGENIDES
DATA ANALYSIS
DEPOSITION
DIELECTRIC MATERIALS
ELLIPSOMETRY
FOURIER TRANSFORM SPECTROMETERS
GLASS
HARDNESS
IMPURITIES
MORPHOLOGY
OXYGEN
REFRACTIVE INDEX
SCANNING ELECTRON MICROSCOPY
SERVICE LIFE
THIN FILMS
WEAR RESISTANCE