Preliminary investigation on young’s modulus measurement of cantilever beam by integrating nanoindenter with optical system

Journal Article · Sat Mar 15 04:00:00 EDT 2014 · Experimental Techniques

DOI:https://doi.org/10.1111/J.1747-1567.2011.00784.X· OSTI ID:22771567

Hsu, J. -S. ^[1]; Chih, Y. -K. ^[2]; Hu, W. -C. ^[3]

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1. National Formosa University, Department of Power Mechanical Engineering (China)
2. Industrial Technology Research Institute (ITRI), Center for Measurement Standards (CMS) (China)
3. Feng Chia University, Department of Mechanical and Computer-Aided Engineering (China)

Nanoindenter has been used to directly indent on the cantilever beam to measure Young’s modulus such that the substrate effects can be avoided. However, the deflections of cantilever beam are indirectly extracted from the displacement of nanoindenter and therefore their measurement results are easily influenced by local behaviors around the indentation. In this paper, to the authors’ best knowledge, this is the first time that the nanoindenter is integrated with an optical system to measure Young’s modulus of cantilever beam. The deflection of cantilever beam is directly measured from a specially designed optical system. The influences of substrate effects and local behaviors around indentation are simultaneously avoided from the proposed methodology.

• OSTI ID: 22771567
• Journal Information: Experimental Techniques, Journal Name: Experimental Techniques Journal Issue: 2 Vol. 38; ISSN 0732-8818; ISSN EXPTD2
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
DESIGN
INDENTATION TESTING
OPTICAL SYSTEMS
SUBSTRATES
YOUNG MODULUS