Experimental Study of Spontaneous-Emission Enhancement in Tamm Plasmon Structures with an Organic Active Region

Journal Article · Thu Nov 15 04:00:00 EST 2018 · Semiconductors

DOI:https://doi.org/10.1134/S1063782618110155· OSTI ID:22749727

Selenin, N.; Mikhrin, S. ^[1]; Sa Pereira, D. de; Menelaou, C.; Monkman, A. P. ^[2]; Kaliteevski, M. A. ^[3]

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1. Innolume GmbH (Germany)
2. Physics Department, Durham University, South Road (United Kingdom)
3. Saint Petersburg Academic University, Nanotechnology Research and Education Center,Russian Academy of Sciences (Russian Federation)

Spontaneous-emission enhancement in a Tamm plasmon microcavity with an active region with organic material 4.4'-bis(N-carbazolyl)-1.1'-biphenyl (CBP) is theoretically and experimentally studied. The microcavity consisted of a Bragg reflector made of silicon oxide and tantalum oxide, over which CBP and silver layers are applied. The dependences of the Purcell modal factor on the emission direction and frequency, as well as the Purcell factor spectrum are calculated. The emission and fluorescence decay spectra in time are measured in the ultraviolet range. It is found that the probability of spontaneous emission increases and the maximum Purcell factor reaches three at frequencies corresponding to eigenmodes of the Tamm plasmon.

• OSTI ID: 22749727
• Journal Information: Semiconductors, Journal Name: Semiconductors Journal Issue: 11 Vol. 52; ISSN SMICES; ISSN 1063-7826
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
PLASMONS
SILICON OXIDES
TANTALUM OXIDES
ULTRAVIOLET RADIATION