Imaging diffraction VLS spectrometer for a wavelength range λ > 120 Å

Journal Article · Wed Feb 01 00:00:00 EST 2017 · Quantum Electronics (Woodbury, N.Y.)

DOI:https://doi.org/10.1070/QEL16261· OSTI ID:22724731

Vishnyakov, E. A.; Kolesnikov, A. O.; Kuzin, A. A.; Negrov, D. V.; Ragozin, E. N.; Sasorov, P. V.; Shatokhin, A. N.

A broadband stigmatic (imaging) soft X-ray ( λ > 120 Å) spectrometer is experimentally realised. The optical configuration of the spectrometer comprises a plane grazing-incidence reflection grating with a spacing varying across its aperture according to a preassigned law [a so-called varied line-space (VLS) grating] and a broadband spherical normal-incidence mirror with an aperiodic Mo/Si multilayer structure. The average plate scale amounts to ∼5.5 Å mm{sup −1}. The radiation is recorded with a matrix CCD detector (2048 × 1024 pixels of size 13 μm). The line spectra of the multiply charged ions LiIII and FV–FVII excited in laser-produced plasma are recorded with a spatial resolution of ∼26 μm and a spectral resolving power R ≈ 500 is experimentally demonstrated. (paper)

• OSTI ID: 22724731
• Journal Information: Quantum Electronics (Woodbury, N.Y.), Vol. 47, Issue 1; Other Information: Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7818
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
APERTURES
CHARGE-COUPLED DEVICES
DIFFRACTION
GRATINGS
INCIDENCE ANGLE
LASER-PRODUCED PLASMA
LAYERS
MOLYBDENUM
REFLECTION
SILICON
SOFT X RADIATION
SPATIAL RESOLUTION
SPHERICAL CONFIGURATION
WAVELENGTHS
X-RAY SPECTROMETERS