Threshold characteristics of a semiconductor quantum-well laser: inclusion of global electroneutrality in the structure
Journal Article
·
· Quantum Electronics (Woodbury, N.Y.)
- Ioffe Institute, Russian Academy of Sciences, ul. Politekhnicheskaya 26, 194021 St. Petersburg (Russian Federation)
Threshold characteristics of a semiconductor quantum-well (QW) laser are calculated using the global electroneutrality condition, which includes charge carriers both in the active and waveguide regions and thus presents an equality of the total charge of electrons to the total charge of holes in these two regions. It is shown that at the lasing threshold, the densities of electrons in the QW and the waveguide region are not equal to the densities of holes in these regions, i.e., the local electroneutrality condition is violated in each of the regions. Depending on the velocities of the carrier capture from the waveguide region into the QW, the electron density can be either higher or lower than the hole density (both in the QW and in the waveguide region). The charge of the carriers of each sign in the waveguide region is shown to be greater than that in the QW. (paper)
- OSTI ID:
- 22724569
- Journal Information:
- Quantum Electronics (Woodbury, N.Y.), Journal Name: Quantum Electronics (Woodbury, N.Y.) Journal Issue: 9 Vol. 46; ISSN 1063-7818
- Country of Publication:
- United States
- Language:
- English
Similar Records
Threshold characteristics of semiconductor lasers under conditions of violation of electroneutrality in quantum wells
Violation of Local Electroneutrality in the Quantum Well of a Semiconductor Laser with Asymmetric Barrier Layers
Effect of intraband carrier relaxation on the threshold characteristics of quantum well lasers
Journal Article
·
Fri May 31 00:00:00 EDT 2013
· Quantum Electronics (Woodbury, N.Y.)
·
OSTI ID:22163106
Violation of Local Electroneutrality in the Quantum Well of a Semiconductor Laser with Asymmetric Barrier Layers
Journal Article
·
Fri Dec 14 23:00:00 EST 2018
· Semiconductors
·
OSTI ID:22749699
Effect of intraband carrier relaxation on the threshold characteristics of quantum well lasers
Journal Article
·
Sat Apr 15 00:00:00 EDT 2006
· Semiconductors
·
OSTI ID:21088554