A study approach on ferroelectric domains in BaTiO{sub 3}

Journal Article · Sat Oct 15 00:00:00 EDT 2016 · Materials Characterization

DOI:https://doi.org/10.1016/J.MATCHAR.2016.09.015· OSTI ID:22689637

Rocha, L. S.R.; Cavalcanti, C. S. ^[1]; Amoresi, R. A.C., ^[2]; Stojanovic, B. D. ^[3]; Borsari, E. ^[1]; Zaghete, M. A. ^[2]; Simões, A. Z. ^[1]

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1. Faculty of Engineering of Guaratinguetá, São Paulo State University - UNESP, Guaratinguetá, SP (Brazil)
2. Interdisciplinary Laboratory of Electrochemistry and Ceramics, LIEC – Department of Chemistry Techonology, Chemistry Institute, São Paulo State University - UNESP, Araraquara, SP (Brazil)
3. Institute for Multidisciplinary Research, University of Belgrade, Kneza Viselava 1, 11000 Belgrade (Serbia)

Atomic Force Acoustic Microscopy (AFAM) and Piezoresponse Force Microscopy (PFM) were used to study local elastic and electromechanical response in BaTiO{sub 3} ceramics. A commercial multi-mode Scanning Probe Microscopy (SPM) and AFAM mode to image contact stiffness were employed to accomplish the aforementioned purposes. Stiffness parameters along with Young's moduli and piezo coefficients were quantitatively determined. PFM studies were based on electrostatic and electromechanical response from localized tip-surface contact. Comparison was made regarding the Young's moduli obtained by AFAM and PFM. In addition, phase and amplitude images were analyzed based on poling behavior, obtained via the application of − 10 V to + 10 V local voltage. - Highlights: •Nanoscale behavior of piezo domains in BaTiO{sub 3} ferroelectric materials •Use of Atomic Force Acoustic Microscopy (AFAM) and Piezo Force Microscopy (PFM) •Local elastic and electromechanical response in BaTiO{sub 3} ceramics •The young's moduli obtained from AFAM and PFM.

• OSTI ID: 22689637
• Journal Information: Materials Characterization, Vol. 120; Other Information: Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ACOUSTIC MICROSCOPY
ACOUSTIC TESTING
AMPLITUDES
CERAMICS
COMPARATIVE EVALUATIONS
CRYSTAL GROWTH
CRYSTALS
ELASTICITY
ELECTRIC POTENTIAL
FERROELECTRIC MATERIALS
FLEXIBILITY
IMAGES
NANOSTRUCTURES
PIEZOELECTRICITY
SURFACES
TITANATES