Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Simultaneous Elastic and Electromechanical Imaging by Scanning Probe Microscopy: Theory and Applications to Ferroelectric and Biological Materials

Journal Article · · Journal of Vacuum Science & Technology B
DOI:https://doi.org/10.1116/1.2052714· OSTI ID:1003047

An approach for combined imaging of elastic and electromechanical properties of materials, referred to as piezoacoustic scanning probe microscopy (PA-SPM), is presented. Applicability of this technique for elastic and electromechanical imaging with nanoscale resolution in such dissimilar materials as ferroelectrics and biological tissues is demonstrated. The PA-SPM signal formation is analyzed based on the theory of nanoelectromechanics of piezoelectric indentation and signal sensitivity to materials properties and imaging conditions. It is shown that simultaneous measurements of local indentation stiffness and indentation piezocoefficient provide the most complete description of the local electroelastic properties for transversally isotropic materials, thus making piezoacoustic SPM a comprehensive imaging and analysis tool. The contrast formation mechanism in the low frequency regime is described in terms of tip-surface contact mechanics. Signal generation volumes for electromechanical and elastic signals are determined and relative sensitivity of piezoresponse force microscopy (PFM) and atomic force acoustic microscopy (AFAM) for topographic cross-talk is established.

Research Organization:
Oak Ridge National Laboratory (ORNL)
Sponsoring Organization:
ORNL LDRD Seed-Money
DOE Contract Number:
AC05-00OR22725
OSTI ID:
1003047
Journal Information:
Journal of Vacuum Science & Technology B, Journal Name: Journal of Vacuum Science & Technology B Journal Issue: 5 Vol. 23; ISSN 0734-211X
Country of Publication:
United States
Language:
English

Similar Records

A study approach on ferroelectric domains in BaTiO{sub 3}
Journal Article · Sat Oct 15 00:00:00 EDT 2016 · Materials Characterization · OSTI ID:22689637

Electromechanical Detection in Scanning Probe Microscopy: Tip Models and Materials Contrast
Journal Article · Sun Dec 31 23:00:00 EST 2006 · Journal of Applied Physics · OSTI ID:931679

Nanoscale Electromechanics of Ferroelectric and Biological Systems: A New Dimension in Scanning Probe Microscopy
Journal Article · Sun Dec 31 23:00:00 EST 2006 · Annual Review of Material Science · OSTI ID:931689