Ferroelectric properties of lead-free polycrystalline CaBi{sub 2}Nb{sub 2}O{sub 9} thin films on glass substrates

Journal Article · Tue Mar 15 04:00:00 EDT 2016 · AIP Advances

DOI:https://doi.org/10.1063/1.4944956· OSTI ID:22611604

Ahn, Yoonho; Jang, Joonkyung ^[1]

---

1. Department of Nanoenergy Engineering, Pusan National University, Busan 609-735 (Korea, Republic of)

CaBi{sub 2}Nb{sub 2}O{sub 9} (CBNO) thin film, a lead-free ferroelectric material, was prepared on a Pt/Ta/glass substrate via pulsed laser deposition. The Ta film was deposited on the glass substrate for a buffer layer. A (115) preferred orientation of the polycrystalline CBNO thin film was verified via X-ray diffraction measurements. The CBNO thin film on a glass substrate exhibited good ferroelectric properties with a remnant polarization of 4.8 μC/cm{sup 2} (2P{sub r} ∼9.6 μC/cm{sup 2}), although it had lower polarization than the epitaxially c-oriented CBNO thin film reported previously. A mosaic-like ferroelectric domain structure was observed via piezoresponse force microscopy. Significantly, the polycrystalline CBNO thin film showed much faster switching behavior within about 100 ns than that of the epitaxially c-oriented CBNO thin film.

• OSTI ID: 22611604
• Journal Information: AIP Advances, Journal Name: AIP Advances Journal Issue: 3 Vol. 6; ISSN AAIDBI; ISSN 2158-3226
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BISMUTH COMPOUNDS
BUFFERS
CALCIUM COMPOUNDS
DOMAIN STRUCTURE
ENERGY BEAM DEPOSITION
EPITAXY
FERROELECTRIC MATERIALS
GLASS
GRAIN ORIENTATION
LASER RADIATION
LAYERS
NIOBATES
PLATINUM
POLARIZATION
POLYCRYSTALS
PULSED IRRADIATION
SUBSTRATES
TANTALUM
THIN FILMS
X-RAY DIFFRACTION