Soft x-ray spectromicroscopy using compact scanning transmission x-ray microscope at the photon factory

Journal Article · Wed Jul 27 04:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4952870· OSTI ID:22608383

Takeichi, Yasuo; Inami, Nobuhito; Ono, Kanta ^[1]; Ueno, Tetsuro ^[2]; Suga, Hiroki ^[3]; Takahashi, Yoshio ^[4]

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1. High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba 305-0801 (Japan)
2. National Institute for Materials Science, 1-2-1 Sengen, Tsukuba 305-0047 (Japan)
3. Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima 739-8526 (Japan)
4. The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033 (Japan)

We report the stability and recent performances of a new type of scanning transmission X-ray microscopy. The optics and compact design of the microscope realized mobility and robust performance. Detailed consideration to the vibration control will be described. The insertion device upgraded to elliptical polarization undulator enabled linear dichroism and circular dichroism experiments.

• OSTI ID: 22608383
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1741; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CONTROL
DESIGN
DICHROISM
MICROSCOPES
MICROSCOPY
OPTICS
PHOTONS
POLARIZATION
PORTABLE EQUIPMENT
SOFT X RADIATION
STABILITY
TRANSMISSION
WIGGLER MAGNETS