Phosphor doping enhanced c-axis alignment and exchange decoupling of sputtered Co-Pt perpendicular thin films

Journal Article · Thu Apr 14 00:00:00 EDT 2016 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4945580· OSTI ID:22594598

Yang, Bo; Qin, Gaowu; Xiao, Na; Li, Zongbin; Zhao, Xiang; Zuo, Liang ^[1]; Zhang, Yudong; Esling, Claude ^[2]

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1. Key Laboratory for Anisotropy and Texture of Materials, Ministry of Education, Northeastern University, Liaoning, Shenyang 110819 (China)
2. Laboratoire d'Étude des Microstructures et de Mécanique des Matériaux (LEM3), CNRS UMR 7239, University of Lorraine, 57045 Metz (France)

In the present work, Co-23.0 at. % Pt and Co-23.0 at. % Pt-3.67 at. % P thin films with their c-axis perpendicular to the substrate surface were fabricated on a glass substrate by DC magnetron sputtering. X-ray diffraction and transmission electron microscopic analyses demonstrate that the doping of P improves the c-axis alignment and forms P-rich non-magnetic phase at grain boundary areas, the latter resulting in inter-granular exchange decoupling between Co-Pt grains. The improved c-axis alignment and the inter-granular exchange decoupling give rise to the increase of the out of plane coercivity and the squareness of the Co-Pt-P films.

• OSTI ID: 22594598
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 14 Vol. 119; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALIGNMENT
COBALT
COERCIVE FORCE
DECOUPLING
ELECTRONS
GLASS
GRAIN BOUNDARIES
MAGNETRONS
PHOSPHORS
PHOSPHORUS
PLATINUM
SPUTTERING
SUBSTRATES
SURFACES
THIN FILMS
X-RAY DIFFRACTION